Statistical methods for reliability data / William Q. Meeker, Luis A. Escobar.
Material type: TextSeries: Wiley series in probability and statistics. Applied probability and statistics.Publication details: New York : Wiley, c1998.Description: xxii, 680 p. : ill. ; 25 cmISBN:- 0471143286 (cloth : alk. paper)
- TS173 .M44 1998
Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|
Books (30-Day Checkout) | Nash Library General Stacks | TS173.M44 1998 | 1 | Available | 33710000833850 |
"A Wiley-Interscience publication."
Professional/scholarly Publishers award winner, 1998.
Includes bibliographical references (p. 645-663) and indexes.
WAR, NEWBERY,
Reliability Concepts and Reliability Data -- Models, Censoring, and Likelihood for Failure-Time Data -- Nonparametric Estimation -- Location-Scale-Based Parametric Distributions -- Other Parametric Distributions -- Probability Plotting -- Parametric Likelihood Fitting Concepts: Exponential Distribution -- Maximum Likelihood for Log-Location-Scale Distributions -- Bootstrap Confidence Intervals -- Planning Life Tests -- Parametric Maximum Likelihood: Other Models -- Prediction of Future Random Quantities -- Degradation Data, Models, and Data Analysis -- Introduction to the Use of Bayesian Methods for Reliability Data -- System Reliability Concepts and Methods -- Analysis of Repairable System and Other Recurrence Data -- Failure-Time Regression Analysis -- Accelerated Test Models -- Accelerated Life Tests -- Planning Accelerated Life Tests -- Accelerated Degradation Tests -- Case Studies and Further Applications.