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Statistical methods for reliability data / William Q. Meeker, Luis A. Escobar.

By: Contributor(s): Material type: TextTextSeries: Wiley series in probability and statistics. Applied probability and statistics.Publication details: New York : Wiley, c1998.Description: xxii, 680 p. : ill. ; 25 cmISBN:
  • 0471143286 (cloth : alk. paper)
Subject(s): LOC classification:
  • TS173 .M44 1998
Contents:
Reliability Concepts and Reliability Data -- Models, Censoring, and Likelihood for Failure-Time Data -- Nonparametric Estimation -- Location-Scale-Based Parametric Distributions -- Other Parametric Distributions -- Probability Plotting -- Parametric Likelihood Fitting Concepts: Exponential Distribution -- Maximum Likelihood for Log-Location-Scale Distributions -- Bootstrap Confidence Intervals -- Planning Life Tests -- Parametric Maximum Likelihood: Other Models -- Prediction of Future Random Quantities -- Degradation Data, Models, and Data Analysis -- Introduction to the Use of Bayesian Methods for Reliability Data -- System Reliability Concepts and Methods -- Analysis of Repairable System and Other Recurrence Data -- Failure-Time Regression Analysis -- Accelerated Test Models -- Accelerated Life Tests -- Planning Accelerated Life Tests -- Accelerated Degradation Tests -- Case Studies and Further Applications.
Holdings
Item type Current library Call number Copy number Status Date due Barcode
Books (30-Day Checkout) Books (30-Day Checkout) Nash Library General Stacks TS173.M44 1998 1 Available 33710000833850

"A Wiley-Interscience publication."

Professional/scholarly Publishers award winner, 1998.

Includes bibliographical references (p. 645-663) and indexes.

WAR, NEWBERY,

Reliability Concepts and Reliability Data -- Models, Censoring, and Likelihood for Failure-Time Data -- Nonparametric Estimation -- Location-Scale-Based Parametric Distributions -- Other Parametric Distributions -- Probability Plotting -- Parametric Likelihood Fitting Concepts: Exponential Distribution -- Maximum Likelihood for Log-Location-Scale Distributions -- Bootstrap Confidence Intervals -- Planning Life Tests -- Parametric Maximum Likelihood: Other Models -- Prediction of Future Random Quantities -- Degradation Data, Models, and Data Analysis -- Introduction to the Use of Bayesian Methods for Reliability Data -- System Reliability Concepts and Methods -- Analysis of Repairable System and Other Recurrence Data -- Failure-Time Regression Analysis -- Accelerated Test Models -- Accelerated Life Tests -- Planning Accelerated Life Tests -- Accelerated Degradation Tests -- Case Studies and Further Applications.